Electron Microscopy for Materials Characterization

About this programme

This provides a detailed description of the electron microscope instrumentation while also teaching the fundamental physics of the image formation. Various electron diffraction, imaging, and sample preparation techniques are presented and discussed, and the practical knowledge necessary to perform these methods and interpret the results are taught. The course also provides a brief overview of two widely-used spectroscopy techniques: energy dispersive X-ray spectroscopy (EDS) and electron energy loss spectroscopy (EELS). Emphasizing how they can be used to obtain information about the electronic structure and chemical composition on length scales ranging from micrometers (SEM) down to the atomic level (STEM). Real-world applications of the various EM techniques for characterization of different types of sustainable materials and nanoparticles are presented in lecture and lab form. • Explain the basic principles of how transmission electron microscopes (TEMs) and scanning electron microscopes (SEMs) are designed and work • Propose suitable sample preparation methods for EM studies • Interpret electron diffraction patterns and the contrasts of different types of EM images • Propose appropriate EM techniques to hold structural information and chemical composition of a material. • Explain the principles of SEM, TEM, STEM, electron diffraction, EDS and EELS experiments and their sample preparation • Report the use of SEM, TEM, STEM, electron diffraction, EDS and EELS, interpret results and draw conclusions about what structural information and / or chemical composition they